From aeb322e1da26dcfc83762d9bc8df83667a22282a Mon Sep 17 00:00:00 2001
From: J08nY
Date: Sun, 14 Jan 2018 15:26:30 +0100
Subject: Export CPLC data and card ATR in test suite outputs.

---
 src/cz/crcs/ectester/common/output/BaseYAMLTestWriter.java | 3 +++
 1 file changed, 3 insertions(+)

(limited to 'src/cz/crcs/ectester/common/output/BaseYAMLTestWriter.java')

diff --git a/src/cz/crcs/ectester/common/output/BaseYAMLTestWriter.java b/src/cz/crcs/ectester/common/output/BaseYAMLTestWriter.java
index af76927..0769e83 100644
--- a/src/cz/crcs/ectester/common/output/BaseYAMLTestWriter.java
+++ b/src/cz/crcs/ectester/common/output/BaseYAMLTestWriter.java
@@ -33,11 +33,14 @@ public abstract class BaseYAMLTestWriter implements TestWriter {
         testSuite.put("desc", suite.getDescription());
 
         testRun.put("suite", testSuite);
+        testRun.put("device", deviceObject(suite));
         testRun.put("tests", tests);
     }
 
     abstract protected Map<String, Object> testableObject(Testable t);
 
+    abstract protected Map<String, Object> deviceObject(TestSuite suite);
+
     private Map<String, Object> testObject(Test t) {
         Map<String, Object> testObj;
         if (t instanceof CompoundTest) {
-- 
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